A technique to address spatial resolution, exceeding the limitations of conventional optical microscopy at a low cost

Key Word : laser microscopy, nonlinear response, saturated excitation (SAX) microscopy

Technology Overview:

This is a technology which addresses spatial resolution, exceeding the limitations of conventional optical microscopy at a low cost.
By separating and detecting light which responds to the irradiated, high luminance light with nonlinear characteristics, the sample is observed with a spatial resolution higher than the limitations of conventional technology (several hundred nanometers).

Benefits:

・There is no need to use special optical devices. This technology can be addressed by only incorporating relatively inexpensive devices such as an optical modulator and lock-in amplifier into a general optical microscope.
・Resolution can be improved further without changing the optical system by applying a secondary or higher nonlinear response (the resolution which is currently demonstrated is 140 nm, but as high as approximately 100 nm is theoretically achievable).
・Can be applied to fluorescent, reflected, transmitted or scattered light to be used in a wide range of uses including observation of intracellular organelles and vibrational spectroscopic observation of a micromachined semiconductor surface and crystal surface.

Potential Applications / Potential Markets:

・Application in fluorescence microscopes and observation technology
・Application in high-resolution, high-speed bio-imaging technology

State of Development / Opportunity / Seeking:

●Opportunity
・Available for exclusive and non-exclusive licensing
・Exclusive/non-exclusive evaluation for defined period (set up for options)
・Collaborative/supportive research
●Seeking
・Licensing
・Development partner

IP Status:

1. WO2006/061947 (Issued: JP, US, EP(GB, DE, FR))
2. WO2011/099269 (Issued: JP, US)

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